Laser-Interferometric Gauging Probe - LM

Laser-Interferometric Gauging Probe - LM

Our LM-Series laser-interferometric gauging probes are precision length measurement instruments, the first of their kind to be capable of making contacting length measurements over ranges of 0-20 mm to 0-50 mm with nanometer precision. Their compactly designed gauging heads and 8h6-mm diameter probe shafts allow their use with conventional length measurement systems.

Their integral miniature interferometer converts displacements of their motor-driven probe shaft into optical interference signals that are transmitted on a fiber optic cable to their optoelectronic signal processing/power supply unit for processing and output as lengths.
Their frequency stabilized He-Ne Laser, which serves as the light source for their miniature interferometer, and their correction of laser wavelengths to compensate for environmental influences form the basis for their high metric precision.

Instrument operation and display of measurement results may be via either a separate keypad/display unit or a PC running the software package supplied.

For more information from SIOS...

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+1 (508) 634-6688U.S. Office

+49 (3641)-6688 0German Office

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