piezo microscope objective fine positioner MIPOS

piezo microscope objective fine positioner MIPOS

piezosystem jena offers a series of positioning systems, MIPOS, for high precision focusing of microscope objectives.

The MIPOS series features a range of motion of up to 500 µm for the microscope objective in combination with nanometer accuracy. The design, which the incorporates a pre-load of the actuator, permits a high resonant frequency of up to 410 Hz and highly parallel travel, as well as an upside-down version for inverse microscopes.

The motion of the MIPOS system is continuous when controlled by an analog signal from a piezo amplifier. The resolution of piezoelectric stages is only limited by the signal noise of the control signal. This allows a positioning accuracy in the nanometer range. Solid state hinges free of play guarantee high dynamics.

The MIPOS is fixed by an adapter onto the microscope. The system can be equipped with all standard thread-rings and are therefore adaptable to all typical models. piezosystem jena can provide a lens diameter of up to 40 mm.

An optional feedback sensor compensates for hysteresis and drift, and offers high stability and linearity in closed-loop operation. The fine positioners of the MIPOS series are an excellent choice for applications such as surface scanning and analysis, AFM microscopy, biotechnology (e.g. cell scanning), beam focusing for printing processes, and semiconductor test equipment.