Equipment for
Nanopositioning

Interferometer & vibrometer offered by SIOS

piezosystem jena is pleased to announce the immediate availability of SIOS interferometric measurement systems for calibration and control of nanoscale movements.

The new metrology product line will include single, double, and triple beam interferometers for length measurements down to 0.1 nm and angular measurements down to 0.01 arcsec. A vibrometer is also available for vibrational analysis. Applications include semiconductor analysis, microscopy, materials analysis, and microstructure measurement.

piezosystem jena is now the exclusive distributor for SIOS measurement systems in the US.


For further question please contact us: usa(at)piezojena.com

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